首页|Resistance Changes of (La, Sr)MnO_3 Thin Film via Exchange Bias Tuning by the Application of an External Electric Field

Resistance Changes of (La, Sr)MnO_3 Thin Film via Exchange Bias Tuning by the Application of an External Electric Field

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We have investigated the relationships between the electric field-induced resistance change and the strength of the exchange interaction of the Cr_2O_3/La_(0.7)Sr_(0.3)MnO_3 (LSMO) magnetic hetero system. The hetero system subjected to field cooling (FC) showed a positive shift in the magnetization curves due to an exchange bias. The exchange bias field changed depending on the FC field. Resulting from the exchange behaviors, the resistance of LSMO film was changed by the application of an electric field to the Cr_2O_3 gate. This resistance change is more likely due to the interface interaction strength between the Cr_2O_3 and LSMO film.

magneto-electric effectexchange biasmagnetic propertieselectric propertieshalf metal

Takeshi Yokota、Shotaro Murata、Sinya Kito、Manabu Gomi

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Graduate School of Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan

2010

Key engineering materials

Key engineering materials

ISSN:1013-9826
年,卷(期):2010.421/422
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