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Local Investigation of Microstructure-lnduced Fatigue Damaging
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NETL
NSTL
From the emission of dislocations till short crack propagation fatigue is a local process determined by the microstructure. In this paper we present experiments based on refined applications of the scanning electron microscope and focused ion beam technique, which give detailed information about crack initiation and the interaction of short fatigue cracks with microstructural elements.
microstructural crack propagationgrain boundariesdislocation structuresfocused ion beam (FIB)crack tomography
Michael Marx、Wolfgang Schaef、Markus T. Welsch、Horst Vehoff
NETL
NSTL
