首页|Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001)

Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001)

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  • NSTL
  • Trans Tech Publications Ltd
(100)/(001)-oriented PZT thick films were grown on SrRuO_3//(100) SrTiO_3 and (100) MgO substrates by matel organic chemical vapor deposition (MOCVD) with different volume fraction of (001) orientation, and were compared with (001) single-oriented epitaxial PZT thick films grown on SrRuO_3//LaNiO_3//(100) CaF_2 by polarized Raman spectroscopy. The spectra from (100)-oriented domain and (001)-oriented domain can be individually observed for the films with the mixture orientation of (100)/(001). Raman analysis revealed the different strain state of (100)-oriented and (001)-oriented domains. Moreover, the rotation dependence of A_1(1TO) mode could be explained by the calculation using the volume fraction of (001)-oriented domains obtained from X-ray reciprocal space mapping analysis for the films with the mixture orientation of (100)/(001). These results suggest the local structure characterized by Raman spectroscopy almost agreed with the structure characterized by XRD analysis for the films with the mixture orientation of (100)/(001).

raman spectroscopyepitaxial PZT filmMOCVD

Mitsumasa Nakajima、Takashi Fujisawa、Ken Nishida、Takashi Yamamoto、Minoru Osada、Hiroshi Naganuma、Soichiro Okamura、Hiroshi Funakubo

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Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, 226-8502, Japan

Department of Communications Engineering, National Defense Academy of Japan 1-10-20 Hashirimizu, Yokosuka-shi, Kanagawa Pref., 239-8686, Japan

Advanced Materials Laboratory, National Institute for Material Science 1-1 Namiki, Tsukubashi, Ibaraki Pref., 305-0044, Japan

Department of Applied Physics, Faculty of Science, Science University of Tokyo 1-3 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan

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2010

10.4028/www.scientific.net/KEM.421-422.99

Key engineering materials

Key engineering materials

ISSN：1013-9826
年,卷(期)：2010.421/422
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