首页|The Effect of Reoxidation on Thermal Shock Resistance of SrTiO_3-based Varistors

The Effect of Reoxidation on Thermal Shock Resistance of SrTiO_3-based Varistors

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The fabrication processes of SrTiO_3-based varistors were investigated to obtain highly thermal-shock-resistant devices. It has been found that the reoxidation conditions are strongly related to the thermal cracking ratio (%) of the varistors. A large compressive stress was generated on the varistor surface by reoxidation, consequent upon the lattice parameter difference between its surface portion and its internal portion. This residual stress on the surface is thought to be the key factor of the achieved thermal-shock-resistance.

semiconductiveSrTiO_3varistorreoxidationthermal crackresidual stress

Atsushi Hitomi、Naoki Chida、Minoru Ogasawara、Dai Matsuoka

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Materials & Process Development Center, TDK Corporation, 570-2 Matsugashita, Minamihatori, Narita, Chiba 286-8588 Japan

Sensors & Actuators Business Group, TDK Corporation, 200 Tachisawa, Hirasawa, Nikaho, Akita 018-0402 Japan

Capacitors Business Group, TDK Corporation, 200 Tachisawa, Hirasawa, Nikaho, Akita 018-0402 Japan

2010

Key engineering materials

Key engineering materials

ISSN:1013-9826
年,卷(期):2010.421/422
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