首页|Computed Tomography for Application in Manufacturing Metrology

Computed Tomography for Application in Manufacturing Metrology

扫码查看
原文链接
  • NETL
  • NSTL
  • Trans Tech Publications Ltd
As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.

manufacturing metrologyX-Ray computed tomographycoordinate metrology

Albert Weckenmann、Philipp Kraemer

展开 >

Chair Quality Management and Manufacturing Metrology (QFM) University Erlangen-Nuremberg Naegelsbachstr. 25, 91052 Erlangen, Germany

2010

10.4028/www.scientific.net/KEM.437.73

Key engineering materials

Key engineering materials

ISSN：1013-9826
年,卷(期)：2010.437
  • 6
  • 4