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Substrate Temperature Effect on Optical Constants of Gd_2O_3 Thin Films

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Effect of substrate temperature on lanthanide oxide material Gd_2O_3 thin films deposited by e-beam evaporation has been reported in the present work. Optical properties and surface morphology of as deposited films have been measured using spectrophotometry and atomic force microscopy respectively. Optical constants such as refractive index, extinction coefficient, band gap and Urbach energy have been determined by analysis of experimentally recorded absorption, transmittance and reflection data in wavelength range 200-800nm. Optical band gap energy shows decreasing while Urbach energy shows increasing behavior with increasing temperature. Extinction coefficient and refractive index with varying wavelengths are also calculated. Surface topographies of all samples are studied by atomic force microscope (AFM) and root mean square (RMS) value of roughness is observed increasing with increasing substrate temperature.

atomic force microscopyoptical band gap energysubstrate temperatureGd_2O_3 films

M.F. Wasiq、M.Y. Nadeem、F. Chollet、S. Atiq

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Department of Physics, Bahauddin Zakariya University Multan, Pakistan

MicroMachines Centre, School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore

Institute of Advanced Materials, Bahauddin Zakariya University, Multan, Pakistan

2010

10.4028/www.scientific.net/KEM.442.96

Key engineering materials

Key engineering materials

ISSN：1013-9826
年,卷(期)：2010.442
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