首页|Microstructure and Properties of TiAlN/AlN Composite Film Deposited on Cam's Profile by Ion Beam Sputtering Technique
Microstructure and Properties of TiAlN/AlN Composite Film Deposited on Cam's Profile by Ion Beam Sputtering Technique
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NETL
NSTL
Trans Tech Publications Ltd
The study reports a new surface formation technology during manufacturing process of parallel indexing cam mechanism, ion beam sputtering deposition, in which the operation temperature can be controlled below the limitation of phases exchanging or at room temperature. Phase exchanging deformation can be avoided and the shape accuracy and dimension accuracy can be improved compared with surface quenching process. The microstructure and properties of TiAlN/AlN composite film deposited on the profile surface of cam (made of 45 steel) by ion beam sputtering deposition were discussed. X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscope (TEM) analysis has been used to characterize film's microstructure and properties. The micro-hardness and adherence grade were tested.
NETL
NSTL
Trans Tech Publications Ltd
