Abstract
Reporters obtained the following quote from the background information supplied by the inventors: ““Field of the Invention“The present invention relates to techniques for detecting defects from images captured of an inspectiontarget.“Description of the Related Art“There is a method applied, in the inspection of infrastructure, as a technique for detecting defectsfrom images captured of an inspection target, that involves performing image processing using a learnedmodel generated by machine learning with AI (artificial intelligence) or by deep learning, which is a type ofmachine learning. In order to accurately detect defects in this case, it is desirable to set an optimal modelfor the images to be processed and to adjust the parameters.
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