首页|Patent Issued for System, method, and computer program for defect resolution (USPTO 11868208)
Patent Issued for System, method, and computer program for defect resolution (USPTO 11868208)
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From the background information supplied by the inventors, news correspondents obtained the followingquote: “Defects can be detected in computer systems during testing or during production, but in any caseassociated with the execution of some piece of code in the computer system. A defect refers to anunintended functioning within the computer system, and may be caused by an issue in software and/orhardware. Typically, defects are detected as a result of an error being generated by the computer systemor some other unintended behavior being exhibited in the computer system.
Amdocs Development LimitedBusinessCyborgsEmerging TechnologiesMachine Learning
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