首页|Patent Issued for Surface topography measurement systems (USPTO 11889173)
Patent Issued for Surface topography measurement systems (USPTO 11889173)
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
NETL
NSTL
From Alexandria, Virginia, NewsRx journalists report that a patent by the inventors Adelson, Edward H. (Winchester, MA, US), Rohaly, Janos (Concord, MA, US), filed on May 17, 2021, was published online on January 30, 2024. The patent’s assignee for patent number 11889173 is GelSight Inc. (Waltham, Massachusetts, United States). News editors obtained the following quote from the background information supplied by the inventors: “One type of high-resolution system for measuring surface topography uses a clear elastomer with a reflective coating disposed on a rigid optical substrate. While such systems usefully permit many types of accurate, detailed surface measurements, the elastomer can delaminate and become damaged over the course of multiple uses. At the same time, replacing the elastomer is error prone, and can be challenging for end users of such systems. There remains a need for improved surface topography measurement systems that facilitate rapid and convenient elastomer changes by end users.”
NETL
NSTL
