首页|Researchers Submit Patent Application, 'Inspection System', for Approval (USPTO 20240044807)
Researchers Submit Patent Application, 'Inspection System', for Approval (USPTO 20240044807)
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From Washington, D.C., NewsRx journalists report that a patent application by the inventors ENDO, Tomoya (Yamanashi, JP); Fujihara, Jun (Yamanashi, JP); Ishida, Yuki (Yamanashi, JP); Konishi, Kentaro (Yamanashi, JP), filed on July 20, 2023, was made available online on February 8, 2024. No assignee for this patent application has been made. News editors obtained the following quote from the background information supplied by the inventors: “Japanese Laid-open Patent Publication No. 2017-112387 discloses an inspection system including a cell tower having a plurality of cells (inspection units) for inspecting a plurality of substrates (wafers), and a loader for loading and unloading a substrate. This inspection system has a structure in which a test head can be taken out from each inspection unit in order to replace a main board used for inspection.” As a supplement to the background information on this patent application, NewsRx correspondents also obtained the inventors’ summary information for this patent application: “The present disclosure provides a technique capable of easily changing the number of inspection units depending on inspection contents and considerably reducing time required for maintenance of the inspection units.
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