首页|'Optimized Path Planning for Defect Inspection based on Effective Region Coverage' in Patent Application Approval Process (USPTO 20240048848)
'Optimized Path Planning for Defect Inspection based on Effective Region Coverage' in Patent Application Approval Process (USPTO 20240048848)
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A patent application by the inventors CHIK, Tai Wai David (Hong Kong, CN); WONG, Chi Shing (Hong Kong, CN), filed on August 2, 2022, was made available online on February 8, 2024, according to news reporting originating from Washington, D.C., by NewsRx correspondents. This patent application has not been assigned to a company or institution. The following quote was obtained by the news editors from the background information supplied by the inventors: “Surface inspection is an important and necessary procedure in manufacturing and maintenance in that it is related to quality control and even safety of a product. For instance, surface inspection is useful for identifying cracks on a train rail or an airplane, etc. “Conventionally, an inspection process involves human eyes in making judgement so that poor reliability is an issue. To ensure uniformity in the inspection, automated or robotic inspection systems have been developed to resolve this issue, together with the advantages of increasing efficiency and productivity of the inspection process. One problem associated with the inspection process is that a camera or an imaging sensor can only cover a portion of an inspected object from a particular viewpoint, so that planning of a path traversed by the camera or the imaging sensor is required. Methods for path planning have been developed in the art, e.g.: E. GLORIEUXA, P. FRANCIOSA and D. CEGLAREK, “Coverage Path Planning with Targeted Viewpoint Sampling for Robotic Free-Form Surface Inspection,” Robotics and Computer-Integrated Manufacturing, vol. 61, February 2020, 101843; W. R. SCOTT, G. ROTH and J.-F. RIVEST, “View Planning for Automated Three-Dimensional Object Reconstruction and Inspection,” ACM Computing Surveys, vol. 35, no. 1, March 2003, pp. 64-96; U.S. Pat. No. 8,059,151 B2; and CN 113343355A.
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