首页|Pennsylvania State University (Penn State) Reports Findings in Machine Learning (High Fidelity Machine-Learning-Assisted False Positive Discrimination in Loop-M ediated Isothermal Amplification Using Nanopore-Based Sizing and Counting)
Pennsylvania State University (Penn State) Reports Findings in Machine Learning (High Fidelity Machine-Learning-Assisted False Positive Discrimination in Loop-M ediated Isothermal Amplification Using Nanopore-Based Sizing and Counting)
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By a News Reporter-Staff News Editor at Robotics & Machine Learning Daily News Daily News-New research on Machine Learning is th e subject of a report.According to news reporting originating in University Par k,Pennsylvania,by NewsRx journalists,research stated,"Loopmediated isotherm al amplification (LAMP) is a rapid,sensitive,and cost-effective method for dev eloping point-of-care nucleic acid testing due to its isothermal nature.Yet,LA MP can suffer from the issue of false positives,which can compromise the specif icity of the results." The news reporters obtained a quote from the research from Pennsylvania State Un iversity (Penn State),"LAMP false positives typically arise due to contaminatio n,nonspecific amplification,and nonspecific signal reporting (intercalating dy es,colorimetric,turbidity,etc.).While dye-labeled primers or probes have bee n introduced for multiplexed detection and enhanced specificity in LAMP assays,they carry the risk of reaction inhibition.This inhibition can result from the labeled primers with fluorophores or quenchers and probes that do not fully diss ociate during reaction.This work demonstrated a nanoporebased system for probe -free LAMP readouts by employing amplicon sizing and counting,analogous to an e lectronic version of gel electrophoresis.We first developed a model to explore LAMP kinetics and verified distinct patterns between true and false positives vi a gel electrophoresis.Subsequently,we implemented nanopore sized counting and calibrated the event charge deficit (ECD) values and frequencies to ensure a fai r analysis of amplicon profiles."
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