首页|Research from University of California Berkeley Yields New Data on Machine Learn ing (Integrated analysis of X-ray diffraction patterns and pair distribution fun ctions for machine-learned phase identification)
Research from University of California Berkeley Yields New Data on Machine Learn ing (Integrated analysis of X-ray diffraction patterns and pair distribution fun ctions for machine-learned phase identification)
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By a News Reporter-Staff News Editor at Robotics & Machine Learning Daily News Daily News – Investigators publish new report on ar tificial intelligence. According to news reporting out of the University of Cali fornia Berkeley by NewsRx editors, research stated, “To bolster the accuracy of existing methods for automated phase identification from X-ray diffraction (XRD) patterns, we introduce a machine learning approach that uses a dual representat ion whereby XRD patterns are augmented with simulated pair distribution function s (PDFs).” Financial supporters for this research include Doe | Laboratory Directed Researc h And Development; Nsf | Nsf Office of The Director | Office of International Sc ience And Engineering.
University of California BerkeleyCybor gsEmerging TechnologiesMachine Learning
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