首页|Researchers Submit Patent Application, "Method Of Error Vector Magnitude (Evm) M inimization For A Radio Frequency (Rf) Measurement Equipment, And Rf Measurement Equipment", for Approval (USPTO 20240063921)
Researchers Submit Patent Application, "Method Of Error Vector Magnitude (Evm) M inimization For A Radio Frequency (Rf) Measurement Equipment, And Rf Measurement Equipment", for Approval (USPTO 20240063921)
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By a News Reporter-Staff News Editor at Robotics & Machine Learning Daily News Daily News-From Washington, D.C., NewsRx journali sts report that a patent application by the inventors DORER, Alexander (Augsburg, DE); SIMON, Martin (Otterfing, DE), filed on August 17, 2022, was made availab le online on February 22, 2024. No assignee for this patent application has been made. News editors obtained the following quote from the background information suppli ed by the inventors: "Communication test equipment typically comprises receive ( RX) and transmit (TX) chains. A competitivity of such a communication tester is indicated, most importantly, by its EVM, a measure of a deviation of received sy mbols of a communication signal from an ideal symbol constellation. EVM is norma lly dominated by thermal noise (SNR) for low signal power and by nonlinear disto rtions (IMD3) for high signal power. EVM minimization requires an optimization o f power levels along the respective RX/TX chain over a wide dynamic range by int erposed adjustable attenuators and/or adjustable amplifiers. "Conventionally, optimum power levels along the respective RX/TX chain are predi cted in accordance with data sheets or measurements, and any variations due to c omponent/production tolerances are determined and saved in the communication tes ter during production. Still, a self-optimization of the communication tester ma y take several hours and may not be carried out during ongoing operations. Tempe rature variations of power amplification are compensated for arithmetically by a correction factor. The adjustment of the input and output power levels of the r espective RX/TX chain for the EVM measurement tends to be cumbersome."
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