首页|Patent Application Titled 'Edge Defect Detection Via Image Analytics' Published Online (USPTO 20240095899)
Patent Application Titled 'Edge Defect Detection Via Image Analytics' Published Online (USPTO 20240095899)
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Reporters obtained the following quote from the background information supplied by the inventors:“Manufacturing equipment include different parts that are used to produce products. For example, substrate processing equipment includes parts that are used to produce substrates (e.g., process substrates). Thequality and cleanliness of the parts affects the performance data of the products.”In addition to obtaining background information on this patent application, News Rx editors alsoobtained the inventors’ summary information for this patent appl ication: “The following is a simplifiedsummary of the disclosure in order to pr ovide a basic understanding of some aspects of the disclosure. Thissummary is n ot an extensive overview of the disclosure. It is intended to neither identify k ey or criticalelements of the disclosure, nor delineate any scope of the partic ular implementations of the disclosure orany scope of the claims. Its sole purp ose is to present some concepts of the disclosure in a simplified formas a prel ude to the more detailed description that is presented later.
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