首页|'Systems And Methods For Component Detection In A Manufacturing Environment' in Patent Application Approval Process (USPTO 20240095311)
'Systems And Methods For Component Detection In A Manufacturing Environment' in Patent Application Approval Process (USPTO 20240095311)
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The following quote was obtained by the news editors from the background informa tion supplied by theinventors: “The statements in this section merely provide b ackground information related to the presentdisclosure and may not constitute p rior art.“In a manufacturing environment, component detection and pose estimation is util ized to performautomated assembly tasks. As an example, a control system may pe rform a machine-learning routine todetect a particular component, determine one or more parameters associated with the component, andinstruct another manufact uring system, such as a robot or machining device, to perform an automatedtask based on the one or more parameters. However, machine-learning routines may requ ire large amountsof training data and time to properly train the control system to accurately perform component detectionroutines. These issues associated wit h machine-learning routines, among other issues, are addressed bythe present di sclosure.”
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