首页|Patent Application Titled 'Thermographic Imaging For Quality Analysis' Published Online (USPTO 20240142312)
Patent Application Titled 'Thermographic Imaging For Quality Analysis' Published Online (USPTO 20240142312)
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Reporters obtained the following quote from the background information supplied by the inventors: “The present disclosure relates to quality analysis, and, more specifically, to thermographic imaging for quality analysis. “Quality analysis can include inspecting components to verify compliance with en gineering specifications. Inspection can take various forms. For example, visual inspection can be performed to detect obvious deformities, defects, and/or defi ciencies in a manufactured component. Tools and/or fixtures can be used to preci sely measure dimensions, finishes, weights, and/or other characteristics of a co mponent. In some situations, functionality can be tested or simulated to verify satisfactory performance for an end-use application.”