首页|Patent Application Titled 'Laue Measurement System With Turntable And Method Of Operating The Same' Published Online (USPTO 20240151662)
Patent Application Titled 'Laue Measurement System With Turntable And Method Of Operating The Same' Published Online (USPTO 20240151662)
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Reporters obtained the following quote from the background information supplied by the inventors: “Laue diffraction is used to measure crystal orientation. One difference between a Laue instrument and a traditional powder diffractometer is that polychromatic radiation (e.g., Bremsstrahlung radiation) is used instead of a monochromatic beam. There are two ways of performing X-ray diffraction using Laue images. In transmission Laue systems, the film or X-ray detector is placed behind the crystal to record X-ray beams which are transmitted through the cryst al. In back-reflection Laue systems, also generally referred to herein as “back- reflection Laue systems”, the actual film or X-ray detector is placed between th e X-ray source and the crystal. Thus, the X-ray beams which are diffracted in a backwards direction are recorded. The X-ray source/crystal/detector arrangement of back-reflection Laue systems also typically provides for a compact size relat ive to a transmission Laue system.
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