Robotics & Machine Learning Daily News2024,Issue(MAY.24) :112-117.

Patent Application Titled 'Laue Measurement System With Turntable And Method Of Operating The Same' Published Online (USPTO 20240151662)

Robotics & Machine Learning Daily News2024,Issue(MAY.24) :112-117.

Patent Application Titled 'Laue Measurement System With Turntable And Method Of Operating The Same' Published Online (USPTO 20240151662)

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Abstract

Reporters obtained the following quote from the background information supplied by the inventors: “Laue diffraction is used to measure crystal orientation. One difference between a Laue instrument and a traditional powder diffractometer is that polychromatic radiation (e.g., Bremsstrahlung radiation) is used instead of a monochromatic beam. There are two ways of performing X-ray diffraction using Laue images. In transmission Laue systems, the film or X-ray detector is placed behind the crystal to record X-ray beams which are transmitted through the cryst al. In back-reflection Laue systems, also generally referred to herein as “back- reflection Laue systems”, the actual film or X-ray detector is placed between th e X-ray source and the crystal. Thus, the X-ray beams which are diffracted in a backwards direction are recorded. The X-ray source/crystal/detector arrangement of back-reflection Laue systems also typically provides for a compact size relat ive to a transmission Laue system.

Key words

Emerging Technologies/Machine Learning/Patent Application/Robotics/Robots

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出版年

2024
Robotics & Machine Learning Daily News

Robotics & Machine Learning Daily News

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