Abstract
News editors obtained the following quote from the background information suppli ed by the inventors:“It is common to subject integrated circuits, either packag ed or unpackaged, to environmental andelectronic testing as an operation in a m anufacturing processes. Typically in such testing, the integratedcircuit device s are subject to electrical testing, e.g., “test patterns,” to confirm functiona lity while contemporaneouslybeing subjected to environmental stress. For exampl e, an integrated circuit is heatedand/or cooled to its specification limits whi le being electrically tested. In some cases, e.g., for qualificationtesting, an integrated circuit may be stressed beyond its specifications, for example, to d eterminefailure points and/or establish “guard band” on its environmental speci fications.
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