Abstract
The following quote was obtained by the news editors from the background informa tion supplied bythe inventors: ““Technical Field“The present invention relates to a coating evaluation device and a coating eval uation method.“Background Information“An invention is known that selectively measures a size of an amplitude in undul ations having awavelength of 1 to 10 mm, from among undulations in a surface of a coating, and evaluates a coatingappearance of the surface of the coating acc ording to a magnitude of measurement results (See, JapaneseLaid-Open Patent App lication No. 2006-266728, referred to herein as Patent Document 1).”
NETL
NSTL