首页|Patent Application Titled 'Texture Mapping To Polygonal Models For Industrial In spections' Published Online (USPTO20240265616)
Patent Application Titled 'Texture Mapping To Polygonal Models For Industrial In spections' Published Online (USPTO20240265616)
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Reporters obtained the following quote from the background information supplied by the inventors:“The cost of quality for industrial manufacturing, particularl y costs associated with inspection and prevention,can negatively impact profita bility. Highly automated, high volume industrial processes requireextensive amo unts of information to be captured and analyzed. In this regard, industrial imag ing systems,including one or more of thermal imaging systems (e.g., near-infrar ed (NIR) and infrared (IR)systems), optical imaging systems (e.g., Red-Green-Bl ue (RGB), and Hue-Intensity-Saturation (HIS), andmonochrome imaging systems), h yperspectral imaging systems (HIS), and other electromagnetic (EM)wave detectio n based imaging systems, can be used to capture information about an industrial process forinspection and/or control purposes, and combined with machine learni ng systems that aid in the analysisand processing of such information.
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