首页|Patent Issued for Measurement apparatus, control apparatus, and control method ( USPTO 12078478)
Patent Issued for Measurement apparatus, control apparatus, and control method ( USPTO 12078478)
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
NETL
NSTL
News editors obtained the following quote from the background information suppli ed by the inventors: “The present disclosure relates to a measurement apparatus, a control apparatus, and a control method for measuring a workpiece. “As disclosed in Japanese Unexamined Patent Application Publication No. 2006-329 903, conventionally, a three-dimensional measurement method for measuring the ge ometry of a workpiece has been known. “In the conventional measurement method, it is necessary to teach the route to m ove a probe for measuring the geometry of a workpiece. When teaching is performe d every time the direction of the workpiece or the type of workpiece is changed, the ratio of the time required for teaching within the measurement time increas es and so the measurement efficiency decreases. Thus, a method to reduce teachin g time has been required.”
NETL
NSTL
