首页|Investigators at National Institute of Technology Silchar Discuss Findings in Na nowires (A Machine Learning Approach To Accelerate Reliability Prediction In Nan owire Fets From Self-heating Perspective)

Investigators at National Institute of Technology Silchar Discuss Findings in Na nowires (A Machine Learning Approach To Accelerate Reliability Prediction In Nan owire Fets From Self-heating Perspective)

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2024 OCT 03 (NewsRx)-By a News Reporter-Staff News Editor at Robotics & Machine Learning Daily News-Research findings on Nanotechnology - Nanowires a re discussed in a new report. According to news reporting from Silchar, India, b y NewsRx journalists, research stated, "Nanowire Field Effect Transistors (NWFET s) have been considered as the next-generation technology for sub-10 nm technolo gy nodes, succeeding FinFETs. However, the highly confined nature of Nanowire FE Ts creates reliability issues that significantly impact their performance." Financial support for this research came from Science and Engineering Research B oard, DST, Govt. of India.

SilcharIndiaAsiaCyborgsEmerging TechnologiesMachine LearningNanotechnologyNanowiresTechnologyNational Institute of Technology Silchar

2024

Robotics & Machine Learning Daily News

Robotics & Machine Learning Daily News

ISSN:
年,卷(期):2024.(Oct.3)