Abstract
2024 OCT 03 (NewsRx)-By a News Reporter-Staff News Editor at Robotics & Machine Learning Daily News Daily News-A patent by the inventors Ike, Tsukasa (Tokyo, JP), Imoto, Kazunori (Kawasaki, JP), Nakai, Tomohiro (Kawasaki, JP), fi led on February 26, 2021, was published online on September 17, 2024, according to news reporting originating from Alexandria, Virginia, by NewsRx correspondent s. Patent number 12094098 is assigned to Kabushiki Kaisha Toshiba (Tokyo, Japan). The following quote was obtained by the news editors from the background informa tion supplied by the inventors: "In a manufacturing processing for semiconductor s or the like, defect management is important to accurately monitor the manufact uring quality and improve the yield. Because inspection data in defect managemen t is enormous and the inspection items include many different items, the work of manually checking the inspection data is not easy. For this reason, in recent y ears, machine learning have been used in defect management, and classification m odels of determining the type of the defect from inspection images have attracte d attention.
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