首页|Observation of greater blister skin thickness compared with the implantation depth of high-energy helium in tungsten
Observation of greater blister skin thickness compared with the implantation depth of high-energy helium in tungsten
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NETL
NSTL
Elsevier
Blistering of pure tungsten by MeV helium (He) bombardment was investigated by examination of the thickness of the blister skin. Polycrystalline tungsten (W) was fabricated by powder metallurgy and irradiated with, 4 MeV He2+, of fluence 1018 ions cm- 2, and a flux of 7 x 1013 ions cm- 2s- 1 at 332 K. We observed that the thickness of the blister skin was greater than anticipated with respect to the peak in the amount of He in W following focused ion beam (FIB) and a scanning electron microscopy (SEM) examination. He bubbles were observed at the position of the crack with transmission electron microscopy (TEM). Yield stress vs displacement per atom (DPA) was calculated. The stress increaseed from the surface to the maximum penetration depth and was shown to reach a minimum at a deeper position than the peak in the amount of implanted He.