Abstract
The following quote was obtained by the news editors from the background informa tion supplied bythe inventors: “In recent years there has been an increased nee d for tools that assist operators in theirinspection of X-ray images. This is d riven by the demand for higher throughput scanning systems, wherethe bottleneck in scanning high volumes rapidly is typically due to the image adjudication tim e.“Many tools, such as material classification techniques, already exist for assis ting operators. However,such tools are limited in their function, require an op erator to manually select buttons to display theresults of the tool, and provid e no definitive measure of object or material presence within the image. Inorde r to significantly reduce the inspection time of X-ray images, targeted material detection algorithmsare required. Such algorithms aim to identify the presence of specific items or groups of items based ontargeted item lists.
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