首页|Explainable Deep Learning Approach for High Impedance Fault Localization in Resonant Distribution Networks Considering Quantization Noise

Explainable Deep Learning Approach for High Impedance Fault Localization in Resonant Distribution Networks Considering Quantization Noise

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ABSTRACT In addressing the quantization noise challenge in high impedance fault (HIF) localization within resonant distribution networks, we propose a cutting‐edge, explainable deep learning approach that significantly advances existing methods. This approach utilizes differential zero‐sequence voltage (DZSV) and zero‐sequence current (ZSC) and introduces a novel “Vague” classification to improve localization accuracy by effectively managing quantization noise‐distorted signals. This approach extends beyond the conventional binary classification of “Fault” and “Sound,” incorporating a multi‐scale feature attention (MFA) mechanism for enriched internal explainability and applying gradient‐weighted class activation mapping (Grad‐CAM) to visualize critical input areas precisely. Our model, validated in an industrial prototype, exhibits unparalleled adaptability across various environmental conditions, including environmental noise, variable sampling rates, and triggering deviations. Comparative analysis reveals that our approach outperforms existing methods in managing diverse fault scenarios.

explainable deep learningfault localizationhigh impedance faultquantization noiseresonant distribution networks

Jian‐Hong Gao、Mou‐Fa Guo、Shuyue Lin、Qiteng Hong

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Fuzhou University||University of Hull||Fujian Province University

Fuzhou University||Fujian Province University

University of Hull

University of Strathclyde

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2025

International journal of circuit theory and applications

International journal of circuit theory and applications

ISSN:0098-9886
年,卷(期):2025.53(6)
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