首页|A conjugate gradient weighted least squares reconstruction method with region of interest correction for cone-beam rotational computed laminography

A conjugate gradient weighted least squares reconstruction method with region of interest correction for cone-beam rotational computed laminography

扫码查看
原文链接
  • NETL
  • NSTL
  • Elsevier
Cone-beam rotational computed laminography (CL) is a highly effective inspection technique for nondestructive testing of objects with a large aspect ratio, such as printed circuit boards (PCB) and insulated gate bipolar transistors (IGBT). However, when scanning objects with a large aspect ratio, the projection data may become truncated, resulting in region of interest (ROI) artifacts in the reconstructed image and reducing the contrast of the reconstructed image. To address this issue, we have proposed a weighted factor that considers the length of the ray within the reconstructed volume and the distance between the X-ray source and the detector bin position. We have also developed a method called ROI conjugate gradient weighted least squares (ROI-CGWLS) to suppress ROI artifacts and enhance the contrast of the reconstructed image in Cone-beam rotational CL. Both simulation and real PCB experimental results demonstrate the effectiveness of the proposed ROI-CGWLS method in suppressing ROI artifacts and improving image contrast and resolution compared to other classical reconstruction methods.

Non-destructive testingPrinted Circuit Boards (PCB)Insulated Gate Bipolar Transistor (IGBT)Computed laminographyIterative reconstruction

Chengxiang Wang、Yu He、Jiaxi Wang、Wei Yu

展开 >

School of Mathematical Sciences, Chongqing Normal University, Chongqing, 401331, China

College of Computer Science, Chengdu University, Chengdu, 610100, China

School of Biomedical Engineering and Imaging, Xiaming Medical College, Hubei University of Science and Technology, Xianning, 437100, China||Key Laboratory of Optoelectronic Sensing and Intelligent Control, Hubei University of Science and Technology, Xianning, 437100, China

2025

10.1016/j.ndteint.2025.103396

NDT & E international

NDT & E international

SCI
ISSN：0963-8695
年,卷(期)：2025.155(Oct.)
  • 30