首页|Investigation of Dynamic Space Charge Effects in Pulse-Dilation Framing Camera Utilizing Dilation Pulses
Investigation of Dynamic Space Charge Effects in Pulse-Dilation Framing Camera Utilizing Dilation Pulses
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
NETL
NSTL
IEEE
The dilation pulse (DP) is a critical factor influencing the temporal performance of a magnetic focusing pulse-dilation framing camera (PDFC). As the DP propagates along the photocathode (PC), it not only induces variations in acceleration voltage but also results in different drift times, dilated ratios, and motion radii for the electron pulse (EP) at various PC positions. This significantly affects spatiotemporal dispersion (STD) of the dynamic space charge effect (SCE) during the EP drift process. To address the issue, the drift step recovery diodes (DSRDs) are employed to design the DP. By establishing a connection with the dynamic spatiotemporal characteristics of the EP, the impact on the dynamic SCE is analyzed. Research results indicate that the DSRD circuit can generate four DPs with peak voltages ranging from −3.508 to −1.819 kV, rise times between 236 and 288 ps, average amplitude change rates from 22.36% to 35.0%, and slope change rates from 40.07% to 62.80%. When a specific DP is applied to the 50 mm PC, the transient temporal dispersion (TTD) of the SCE during the EP drift process is inversely proportional to the electron density and drift velocity. The transient spatial dispersion (TSD) is significantly influenced by the EP’s radius and its ratio to the axial width, decreasing as both factors increase. When the four DPs are individually applied to the PC, during the EP drift process, the DP with the smallest amplitude change rate and the largest slope change rate reduces the average temporal dispersion (TD) along the PC from 0.764 to 0.590 ps and decreases non-uniformity from 40.69% to 27.73%. The average spatial dispersion (SD) is reduced from 21.87 to $15.21~\mu $ m, and non-uniformity drops from 39.94% to 26.13%. These findings provide the basis for analyzing and improving the STD and uniformity of the dynamic SCE. Additionally, they offer research insights into integrating high-power pulse technology into ultrafast diagnostic applications.
NETL
NSTL
IEEE
