Advanced Materials2026,Vol.38Issue(7) :e09239.1-e09239.13.DOI:10.1002/adma.202509239

Integrated TRNG and PUF Based on Room-Temperature Phosphorescent Polymer Dielectric Gated Phototransistors

Ruiduan Ji Wei Huang Baoshuai Liang Xiaosong Wu Huiqian Hu Jialong Hu Jie Liu Huacan Wu Shiyu Feng Weiguo Huang
Advanced Materials2026,Vol.38Issue(7) :e09239.1-e09239.13.DOI:10.1002/adma.202509239

Integrated TRNG and PUF Based on Room-Temperature Phosphorescent Polymer Dielectric Gated Phototransistors

Ruiduan Ji 1Wei Huang 2Baoshuai Liang 3Xiaosong Wu 4Huiqian Hu 1Jialong Hu 1Jie Liu 3Huacan Wu 3Shiyu Feng 5Weiguo Huang2
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作者信息

  • 1. State Key Laboratory of Structural Chemistry Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou,Fujian 350002,P.R.China||College of Chemistry Fuzhou University Fuzhou,Fujian 350108,P.R.China
  • 2. State Key Laboratory of Structural Chemistry Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou,Fujian 350002,P.R.China||State Key Laboratory of Structural Chemistry Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou,Fujian 350002,P.R.China||University of Chinese Academy of Sciences 19A Yuquan Road,Beijing 100049,P.R.China||College of Chemistry Fuzhou University Fuzhou,Fujian 350108,P.R.China||Fujian Science & Technology Innovat
  • 3. State Key Laboratory of Structural Chemistry Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou,Fujian 350002,P.R.China||University of Chinese Academy of Sciences 19A Yuquan Road,Beijing 100049,P.R.China
  • 4. State Key Laboratory of Structural Chemistry Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou,Fujian 350002,P.R.China
  • 5. State Key Laboratory of Structural Chemistry Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou,Fujian 350002,P.R.China||University of Chinese Academy of Sciences 19A Yuquan Road,Beijing 100049,P.R.China||College of Chemistry Fuzhou University Fuzhou,Fujian 350108,P.R.China||Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China Fuzhou,Fujian 350002,P.R.China
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Abstract

Harnessing the entropy of multiple transitions between different electronic states in room-temperature phosphorescence (RTP) not only overcomes the drawbacks of authentication via afterglow but also holds significant potential for cryptographic protocols that are immune to attacks from future quantum computers. However, such an objective has yet to be realized. Here, RTP films are incorporated as a dielectric layer in phototransistors, which give two distinct outputs, i.e., phosphorescence (I_p) from the dielectric layer and photocurrent (I_d) across the source-drain electrode. The susceptible thermodynamics of electron transitions and the triplet-to-singlet energy transfer at the dielectric-semiconductor interface causing I_p to vary with each readout, thereby enabling true random number generator (TRNG) functionality. Whereas I_d is mainly governed by film quality and interfacial defects, which vary among different batches due to inherent randomness introduced during fabrication, making it suitable as a physical unclonable function (PUF). Detailed studies reveal that the two outputs demonstrate excellent uniqueness and independence, with a Hamming weight of 0.50, an inter-Hamming distance of 50.27%, a Pearson correlation coefficient of −0.0054, and an encoding capacity of 2~(25) within a 5 × 5 transistor array. This work represents a breakthrough of integrated optoelectronic devices for highly secure authentication while also inspiring new applications for RTP materials.

Key words

phototransistor/physical unclonable functions/privacy protection mutual authentication/room temperature phosphorescence/true random number generator

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出版年

2026
Advanced Materials

Advanced Materials

ISSN:0935-9648
参考文献量47
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