首页|Circular polarized light microscopy to investigate the crystal orientation of aluminium
Circular polarized light microscopy to investigate the crystal orientation of aluminium
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NSTL
Elsevier
? 2022 Elsevier Inc.The link between microstructure, crystallographic texture and mechanical properties is of substantial importance to the understanding of materials behaviour of aluminium alloys. The favoured approach to determine these relations has been electron backscatter diffraction (EBSD) and has received extensive prior attention. However, compared to conventional optical microscopy, EBSD is both cost and potentially time intensive limiting its viability as a widespread method in industrial quality assurance. Following early successes by the authors and other investigators with optically birefringent metals, this investigation assesses the suitability of reflected circular polarized light microscopy (CPLM) as a rapid low-cost alternative to EBSD for cubic systems. Direct comparisons between EBSD crystal orientation maps (COMs) and a quantitative determination of the character of reflected polarized light images is presented to demonstrate that this technique can provide quantitative texture information for aluminium. Further, the inherently surface sensitive nature of the technique allowed further verification of orientation relationships between the substrate and surface oxide only previously made possible by high resolution transmission electron microscopy.
NSTL
Elsevier
