首页|Design criteria for pad and stencil with high pick-and-Place yield
Design criteria for pad and stencil with high pick-and-Place yield
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NSTL
Emerald Group Publishing
Purpose This study aims to focus on the passive components of System in Package SiP modules and discusses the geometric pad designs for 01005-sized passive components, the front end design of the hole size and shape of the stencil and the parameters of the stencil sidewall coating, to determine the optimum parameter combination. Design/methodology/approach This study plans and conducts experiments, where a L8(27) inner orthogonal array is built to consider the control factors, including a L4(23) outer orthogonal array to consider the noise factor, and the experimental data are analyzed by using the technique for order preference by similarity to ideal solution multi-quality analysis method. Findings The results show that the optimum design parameter level combination is that the solder mask opening pad has no solder mask in the lower part of the component, the pad width is 1.1 times that of the component width, the pad length is 1.75 times that of the electrode tip length, the pad spacing is 5 mil, the stencil open area is 90% of the pad area, the stencil opening corner has a 3 mil chamfer angle, and the stencil sidewall is free of nano-coating. Originality/value The parameter design and multi-quality analysis method, as proposed in this study, can effectively develop the layout of passive components on a high-density SiP module substrate, to stabilize the process and increase the production yield.
TOPSISSystem in packageTaguchi experimental designPad designSignal and noise ratioSurface mount technologyOPTIMIZATIONPERFORMANCETOPSIS
Huang, Chien-Yi、Chan, Chao-Chieh、Wang, Ping-Sen、Greene, Christopher
NSTL
Emerald Group Publishing
