首页|Dielectric behavior of Ba(Zr0.3Ti0.7)O-3/Ba(Zr0.05Ti0.95)O-3/SrTiO3 bilayer thin films
Dielectric behavior of Ba(Zr0.3Ti0.7)O-3/Ba(Zr0.05Ti0.95)O-3/SrTiO3 bilayer thin films
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NSTL
Elsevier
To explore comprehensive performance has been the focus of attention utilized advanced technique to prepare different chemical and crystal structures of free-lead dielectric ceramics. In this paper, ferroelectric Ba(Zr0.3Ti0.7) O-3/Ba(Zr0.05Ti0.95)O-3 bilayer thin film has been fabricated on SrTiO3 substrate by pulsed laser deposition technique. X-ray diffraction analysis confirms crystalline nature of the film. The morphology and the ingredient of the film was observed utilizing scanning electron microscope and Energy dispersive spectrometer, respectively. Related electrical measurements, including dielectric and ferroelectric, were recorded for the film. It was found that there are the multi-peaks on dielectric spectrum of the film, which is the discrepancy with Ba(ZrxTi1-x) O-3 target material. It is proposed that the dielectric character of the film is relevance to the intrinsic property of Ba(ZrxTi1-x)O-3 target material and the electric performance of the interface in the film. This work will generate fresh insights into exploring various structure and functional Ba(ZrxTi1-x)O3 material system.
NSTL
Elsevier
