Abstract
Silicon nanocrystals embedded in a silica matrix are good sensitizers of erbium ion photoemission and have application in photonic devices. We have developed a unique synthetic method to produce gram quantities of silicon nanocrystals embedded in a silica matrix containing erbium ions from solution borne precursors. This realization has facilitated a thorough study of the influence of erbium precursor on the chemical, physical and optical properties of the resulting materials. Three erbium precursors, erbium chloride, erbium tris(bis(trimethyl)silyl)amide, and erbium octanoate, were studied using Scanning Electron Microscopy, Energy Dispersive X-Ray Spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and Photoluminescence Spectroscopy. It has been determined that the rare earth complexing ligand dramatically influences the erbium distribution homogeneity, solution processability, physical properties, and optical response. Most importantly we conclusively demonstrate that the optically active erbium ions in the resulting composites reside in the oxide matrix and not within the nanocrystals.