Characterization of wurtzite Zn1-xMgxO epilayers grown on ScAlMgO4 substrate by methods of optical spectroscopy

Trinkler, Laima ¹Aulika, Ilze ¹Krieke, Guna ¹Nilova, Dace ¹Ruska, Rihards ¹Butikova, Jelena ¹Berzina, Baiba ¹Chou, Mitch Ming-Chi ²Chang, Liuwen ²Wen, Meng-Chieh ²Yan, Tao ³Nedzinskas, Ramunas⁴

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作者信息

1. Univ Latvia
2. Natl Sun Yat sen Univ
3. Chinese Acad Sci
4. Ctr Phys Sci & Technol
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Abstract

Wurtzite Zn1-xMgxO epilayers (x = 0, 0.26, 0.44, 0.49, 0.66) grown by the plasma-assisted molecular beam epitaxy on ScAlMgO4 substrate were characterized using the methods of optical spectroscopy: spectroscopic ellipsometry (SE), optical absorption (OA), and photoluminescence (PL). The complex dielectric function in the spectral range of 210-1690 nm, band gap width, exciton absorption and emission parameters, and film quality were studied and discussed. Individual characterization of samples was provided by combining SE and OA measurement results. The observed increase of the band gap up to 4.35 eV with the rise of the MgO content allowed the recommendation of the wurtzite Zn1-xMgxO epilayers as material for UV sensors. The origin of defects hampering the practical application of the materials was discussed.(C) 2022 Elsevier B.V. All rights reserved.

Key words

Zn1 & minus/xMgxO thin films/Optical properties/Optical spectroscopy/Light absorption/Luminescence/Composition fluctuations/ZNO THIN-FILMS/TEMPERATURE-DEPENDENCE/BAND-GAP/MGZNO FILMS/MG CONTENT/ROCK-SALT/PHOTOLUMINESCENCE/MGXZN1-XO/PHASE/ELLIPSOMETRY

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出版年

2022

Journal of Alloys and Compounds

EISCI

ISSN：0925-8388

被引量3

参考文献量74

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