首页|Analyzing the aging profile of serviced GIS O-ring seals under 30-year long-term field aging condition
Analyzing the aging profile of serviced GIS O-ring seals under 30-year long-term field aging condition
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NSTL
Elsevier
? 2022 Elsevier LtdAs the key component of gas-insulated switchgear (GIS), O-ring samples withdrawn from the long-term field aging conditions were of vital importance in the study of their performance. This article collected several serviced EPDM and CR GIS O-rings operated for 8, 9, 18, 25 and 30 years from power substations located at different sites. The two EPDM samples were withdrawn from the fault phase and non-fault phase respectively, during the emergency repair of a trip-out accident. The samples studied were cut into parts and analyzed from their air side and SF6 side by SEM, EDS and FTIR to observe their surface morphology, element migration and carbonyl absorbance. Deformation recovery ratio was proposed as useful index to characterize the recover ability of the serviced GIS O-ring samples. With some simple assumptions, the degradation of CR O-rings was estimated as a 9.6-order reaction.
NSTL
Elsevier
