首页|H2O2 as a strong catalyzer for the growth velocity of SILAR-deposited ZnO thin films

H2O2 as a strong catalyzer for the growth velocity of SILAR-deposited ZnO thin films

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In this work, we report the effects of different H2O2 concentrations on the growth velocity of ZnO thin films deposited by SILAR method.H2O2 effects on the films' growth velocity were studied by Rutherford Backscattering Spectroscopy (RBS) technique. RBS results showed that thickness can be increased from 0 up to 290 +/- 20 [nm] by increasing the H2O2 concentration from 0 to 30 %, evidencing the strong catalyzer effect of H2O2 on the films' growth velocity. Our study provides relevant insights on the use of H(2)O(2 )as a key parameter for tuning the thickness of SILAR-deposited ZnO thin films.

ZnO Thin FilmsSILAR MethodRutherford Backscattering SpectroscopyCHEMICAL BATH DEPOSITIONSOLAR-CELLTHICKNESS

Roa, Simon、Suarez, Sergio、Sandoval, Myrna

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Consejo Nacl Invest Cient & Tecn

CNEA

Univ Concepcion

2022

Chemical Physics Letters

Chemical Physics Letters

EISCI
ISSN:0009-2614
年,卷(期):2022.787
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