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Diagnosability of fault patterns with labeled stochastic Petri nets
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NSTL
Elsevier
This paper is about the diagnosability of fault patterns in timed stochastic discrete event systems. For this purpose, the diagnosability problem is formulated with labeled stochastic Petri net models and pure logical fault pattern nets. A particular composition of a labeled stochastic Petri net with a fault pattern net is proposed and is shown to characterize in an explicit way the fault patterns, including the timing and probabilistic aspects of the underlying system. Logical and probabilistic verifiers are derived, and used to establish a set of conditions to check not only the strong diagnosability property but also weaker notions of diagnosability. (C) 2022 Elsevier Inc. All rights reserved.
Labeled stochastic Petri netsFault patternsDiagnosabilityProbabilistic verificationDISCRETE-EVENT SYSTEMSDIAGNOSISALGORITHM
NSTL
Elsevier
