首页|Dielectric and optical evaluation of high-emissivity coatings for temperature measurements in microwave applications

Dielectric and optical evaluation of high-emissivity coatings for temperature measurements in microwave applications

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  • NSTL
  • Elsevier
In this work, several commercial high-emissivity coatings have been characterized in terms of emissivity, chemical composition and dielectric properties as a function of temperature, under microwave irradiation. Accurate knowledge of their response under exposure to microwaves provides new and crucial information about their practical usability for non-contact temperature measurements in microwave environments. Due to their high metallic content, some of the studied coatings exhibited unexpected microwave-triggered reactions that hindered their use up to the maximum temperature specified by the manufacturers. Emissivity and chemical analyses before and after the heating cycles confirmed the degradation of some of the samples predicted by dielectric measurements. This work illustrates how a careful characterization of optical and dielectric properties under representative operating conditions (temperature range, microwave exposure) is vital in order to select the appropriate reference coating to obtain reliable temperature measurements in microwave applications.

High-emissivity coatingsHigh temperatureMicrowave applicationsEmissivity analysisChemical analysisDielectric properties

Beatriz Garcia-Banos、Paolo Chiariotti、Rachele Napolitano、Giuseppe Pandarese、Laura Navarrete、Gian Marco Revel、Jose M. Catala-Civera

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ITACA Institute, Universitat Politecnica de Valencia, Camino de Vera s/n, 46022 Valencia, Spain

Department of Mechanical Engineering, Politecnico di Milano, Via Giuseppe La Masa 1, 20156 Milano, Italy

Department of Industrial Engineering and Mathematical Sciences, Universita Politecnica delle Marche, Via Brecce Bianche s/n, Ancona, (Italy)

Instituto de Tecnologia Quimica, Universitat Politecnica de Valencia--Consejo Superior de Investigaciones Cientificas, Camino de Vera s/n, 46022 Valencia, Spain

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2022

10.1016/j.measurement.2022.111363

Measurement

Measurement

SCI
ISSN：0263-2241
年,卷(期)：2022.198
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