首页|AC conductivity of amorphous and polycrystalline Cd3As2 films on single crystal substrates of Al2O3
AC conductivity of amorphous and polycrystalline Cd3As2 films on single crystal substrates of Al2O3
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
NSTL
Elsevier
In this work, we present first AC conductivity measurements of both amorphous and polycrystalline Cd3As2 thin films (~50 nm) in the frequency range 25-106 Hz and temperature range 10-300 K. Cd3As2 thin films were grown by non-reactive AC magnetron sputtering. Both samples show a strong frequency dependence of the total conductivity in the order of 10(4) omega(-1) cm(-1). It was found that the DC conductivity, deduced from the total conductivity of Cd3As2 thin films, increases with increasing temperature. The experimental results indicate exponent values s > 1 and s > 2, which contradicts the universal dynamic response. In Cd3As2 films is observed a crossover of metal-semiconductor type at low temperatures, which is characteristic of topological materials. The results show a clearly frequency dependence of the mechanism of AC conductivity of Cd3As2 films in a wide range of temperatures.
AC conductivityCd3As2Thin filmsMetal-semiconductor transitionTopological materialsDIELECTRIC-RELAXATIONMAGNETORESISTANCETRANSPORTGROWTH
Morocho, A. A.、Pilyuk, E. A.、Zakhvalinskii, V. S.、Nikulicheva, T. B.、Yapryntsev, M. N.、Novikov, V. Yu.
NSTL
Elsevier
