首页|Improving the accuracy of alpha particle induced X-ray emission analysis: The role of multiple ionization K X-ray satellites
Improving the accuracy of alpha particle induced X-ray emission analysis: The role of multiple ionization K X-ray satellites
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NSTL
Elsevier
Wavelength-dispersive X-ray spectrometry is used to examine the influence of multiple ionization satellites induced by 3-5 MeV energy helium ion beams upon the accuracy of particle-induced X-ray emission analysis (PIXE). The work extends our prior study of elements magnesium, aluminum and silicon and their oxides to elements phosphorus, chlorine, potassium, calcium, titanium and chromium and, for the latter two, their oxides. Fitting of the spectra with Voigtian peaks enables construction of a database that comprises the mean energies and the relative intensities of up to four distinct satellite groupings. This database provides an empirical means for inclusion of one peak per satellite group when modelling energy-dispersive spectra. This is a useful step towards improving the accuracy of PIXE analysis of materials using helium beams; an example of this is provided using a spectrum recorded by the Curiosity rover on Mars.
X-ray emission spectroscopyPIXE analysisHelium ion beamsMultiple ionization satellitesDistortion of EDX spectraL-SHELL IONIZATIONSPECTRASPECTROMETERSYSTEMATICSSILICON
Cureatz, Daniel J. T.、Kavcic, Matjaz、Petric, Marko、Isakovic, Kristina、Mihalic, Iva Bozicevic、Ramos, Mauricio Rodriguez、Fazinic, Stjepko、Campbell, John L.
NSTL
Elsevier
