首页|Assesment of a model to calculate the refractive index of AlXGa1-XN epilayers using the multi-oscillator model simulation of the infrared reflectance

Assesment of a model to calculate the refractive index of AlXGa1-XN epilayers using the multi-oscillator model simulation of the infrared reflectance

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  • NSTL
  • Elsevier
A formula for the calculation of the refractive index of AlXGa1-XN in the infrared region has previously been proposed. In this paper, the validity of the proposed model is assessed against the multi-oscillator model which simulates the infrared reflectance of AlXGa1-XN epilayers. Acceptable agreement was found between the two models for wavenumbers greater than 3500 cm(-1). Additional validation for the earlier proposed formula is obtained by the calculation of epilayer thicknesses of AlXGa1-XN samples in the infrared region.

AlxGa1-xNRefractive indexInfrared reflectanceMulti-oscillator modelTEMPERATUREDEPENDENCEFILMSGAP

Engelbrecht, J. A. A.、Minnaar, E. G.、van Dyk, E. E.、Westraadt, J. E.、Sephton, B.、Lee, M. E.、Henry, A.

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Nelson Mandela Univ NMU

NMU

NLC CSIR

Linkoping Univ

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2022

10.1016/j.physb.2021.413484

Physica

Physica

ISSN：0921-4526
年,卷(期)：2022.625
  • 41