Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography
Hans, Marcus 1Czigany, Zsolt 2Neuss, Deborah 1Saelker, Janis A. 1Ruess, Holger 1Krause, Janina 1Nayak, Ganesh K. 3Holec, David 3Schneider, Jochen M.1