首页|X-ray computed tomography, electron microscopy, and energy-dispersive X-ray spectroscopy of severed Zelkova serrata roots (Japanese elm tree)
X-ray computed tomography, electron microscopy, and energy-dispersive X-ray spectroscopy of severed Zelkova serrata roots (Japanese elm tree)
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NSTL
Elsevier
X-ray computed tomography (XCT), field emission scanning electron microscopy (FESEM), and energy-dispersive X-ray spectroscopy (EDS) were evaluated for imaging and element identification of woody plant roots. Lateral roots of Japanese zelkova (Zelkova serrata) were severed in spring and maintained in soil for six months. The lateral roots were observed using XCT without maceration and sectioning. The general wood characteristics were discernible to reveal the bark and xylem structures in contrast-inverted tomograms. Virtual sections showed a newly formed ring of woundwood encircling the severed lateral roots. FESEM exhibited secondary xylem structures in which tyloses, fungal hyphae, and aggregates were present. While silicon was dispersed in and around the fungal hyphae, calcium was localized as distinct aggregates using EDS. These results suggest that the combined use of XCT, FESEM, and EDS has merit into the morphological assessment of tree health care, providing virtual sections, high-resolution images, and element composition from an entire woodblock.