首页|Measuring multi-asperity wear with nanoscale precision

Measuring multi-asperity wear with nanoscale precision

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Wear of multi-asperity interfaces remains difficult to predict from first principles, in part because improvements are required in our ability to quantify and track wear across the micro-to nanometer scale. In this work, we developed a 6° of freedom topographical difference method based on large atomic force microscopy (AFM) measurements, up to 90 × 90 μm~2 in size. We detect wear volumes as small as 1.6 × 10~(-11) ± 3.7 × 10~(-12) mm~3 (0.016 μm~3), beyond the sensitivity of many existing techniques for the quantification of wear at multi-asperity interfaces. We show that our wear detection technique can be combined with 100 mN normal force ball-on-flat friction experiments to track nanoscale wear across the entire area of apparent contact.

Wear detectionMulti-asperityPixel-level alignmentAsperity-scale wearTopographical difference method

Cyrian Leriche、Steve Franklin、Bart Weber

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Advanced Research Center for Nanolithography (ARCNL)

2022

Wear

Wear

EISCI
ISSN:0043-1648
年,卷(期):2022.498/499
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