首页|Critical bending wavelengths associated with current sharing temperature degradation in multistage twisted Nb3Sn cable CICC
Critical bending wavelengths associated with current sharing temperature degradation in multistage twisted Nb3Sn cable CICC
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NSTL
Elsevier
The concept of a bending wavelength has been proposed in the description of strand deformation phenomena arising from electromagnetic loads， in cable-in-conduit conductor (CICC) with multistage twisted Nb3Sn cable， that result in the degradation of the CICC current sharing temperature (T-cs)。 A survey of CICC T-cs performance covering Nb3Sn CICC samples from the recent past two decades shows interesting results that can help relate bending wavelength to CICC parameters such as the void fraction (V-f) and the twist pitches of the CICC cable to which the latter has attributed to T-cs degradation according to prior research。 In this paper， a simple cable strand model is used to link CICC parameters especially the CICC V-f to the bending wavelength of the CICC strand。 Through this treatment， a range of bending wavelengths are identified that can be associated to characteristically different T-cs performance behaviour of the CICCs。 The bending wavelength values corresponding to transitions between these characteristically different CICC T-cs behaviours are identified as critical bending wavelengths。 Additionally， a picture of the internal mechanism resulting in T-cs change is presented along with comparisons of bending wavelength values derived from different theories and the value from destructive examination identified in the literature for Nb3Sn CICC samples。
NSTL
Elsevier
