首页|Flying probe measurement accuracy improvement by external LCR integration
Flying probe measurement accuracy improvement by external LCR integration
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NSTL
Elsevier
? 2022 Elsevier LtdThis paper presents a procedure for integrating external stand-alone measurement with the Takaya APT Flying Probe machine (FP). The proposed approach can serve as a guide for merging other types of external test and measurement devices (T&M). The work context resides in a measurement inaccuracy situation reported at a production facility, by one of the most important worldwide automotive manufacturers. In the case of some printed circuit boards (PCBs), the FP machine generated erroneous results when measuring values for different in-circuit-mounted capacitors and inductors. The aim of our work was to resolve this situation. Thus, an integration solution which extends FP measurement capabilities was investigated and deployed. Developed applications operate as an extension of the FP software interface and can be included as a single step within the classical FP test program. Capacitors in the 1 nF to 100 nF ranges were tested. The solution proves viable for measurements on the 10 nF to 100 nF range, where the maximum relative error was 5.28%. Inductors with nominal values in the range 3.3 μH to 100 μH were evaluated with maximum relative errors of 10%. The presented solution proved to be well-suited for testing capacitors higher than 10 nF, while excellent results could be observed in the case of evaluated inductors. A statistical measurement accuracy evaluation demonstrates the appropriateness of such a solution.
NSTL
Elsevier
