首页|Determination of the atomic cohesive energy and Debye temperature from thermal stiffening of the dielectric constant of semiconductors
Determination of the atomic cohesive energy and Debye temperature from thermal stiffening of the dielectric constant of semiconductors
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NSTL
Elsevier
From the perspective of bond-order-length-strength correlation, we have formulated the thermally stiffened dielectric constant and refractive index for semiconductors. It is clarified that: (i) The dielectric constant and refractive index of semiconductors turn from non-linear to linear thermal stiffening at one third of its Debye temperature; (ii) The Debye temperature determines the width of the non-linear part and the reciprocal atomic cohesive energy determines the slope of linear part at high temperatures of the dielectric constant and refractive index curves.
NSTL
Elsevier
