首页|The crystalline nature and samarium substitution improves the nanomechanical and microwave dielectric properties of SBTi thin films
The crystalline nature and samarium substitution improves the nanomechanical and microwave dielectric properties of SBTi thin films
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
NSTL
Elsevier
Samarium substituted SBTi (SrBi3.25Sm0.75Ti4O15) thin films were deposited in the temperature range of 675-750 degrees C on amorphous substrates using radio frequency (RF) sputtering technique. Amorphous to preferred crystalline nature and single phase formation was identified by X-ray diffraction analysis. Atomic force microscopy was used to capture the surface morphology and calculate the grain size. Microwave dielectric properties of SrBi3.25Sm0.75Ti4O15 thin films were investigated at 10 & 20 GHz. The highest dielectric constant (similar to 118 @ 10 GHz, 104 @ 20 GHz) was obtained for films deposited at 725 degrees C with preferred orientation. Nanoindentation and scratch tests were performed using nanoindentation technique in order to evaluate the nanomechanical properties of the SrBi3.25Sm0.75Ti4O15 thin films. The best hardness similar to 9.6 GPa and Young's modulus similar to 120 GPa was observed for the films deposited at 750 degrees C. This study explored that the films with preferred orientation have potential applications in ferroelectric random access memories and actuators.
NSTL
Elsevier
